• 一种用于电容式触控芯片的小面积SAR ADC

    A small area SAR ADC for capacitive touch chip

    • 由于电容式触控芯片对报点率要求一般需要大于120 Hz,需要内置多个ADC实时采样。针对电容式触控领域应用,设计了一款 3.3 V 供电,8 MS/s采样率,14 位精度的小面积逐次逼近型模数转换器(Successive Approximation Register Analog-to-Digital Converter, SAR ADC),采用栅压自举开关实现14 位高精度采样。在减小芯片面积策略上,使用了比例基准二步式DAC(Digital to Analog Converter),实现14位ADC只需要7位电容DAC,有效减少芯片面积。采用了具有三级级联前置放大器的动态比较器,具有速度快功耗低的优势,也能有效减小输入失调电压与噪声。采样保持电路部分,采用了CMOS全差分采样保持电路,可以处理大范围的输入共模信号,且面积较小噪声较低。ADC设计采用180 nm 1P4M CMOS工艺,实现了14位转换位数、有效位11.84、74.03 dB 的信噪失真比,3.3 V电源下功耗为500.9 μW,芯片面积0.16 mm2

       

      Abstract: Due to the high requirement for reporting rate of capacitive touch chips, generally greater than 120 Hz, multiple ADCs need to be built in for real-time sampling. A Small Area Successive approximation Analog-to-Digital Converter (SAR ADC) with 3.3 V power supply, 8 MS/s sampling rate, and 14 bit accuracy has been designed for capacitive touch applications. This design uses a gate voltage bootstrap switch to achieve 14 bit high-precision sampling. In the strategy of reducing chip area, a proportional benchmark two-step DAC (Digital to Analog Converter) is used to achieve a 14 bit ADC with only a 7 bit capacitor DAC, effectively reducing the area. This design also adopts a dynamic comparator with three-stage cascaded preamplifiers, which has the advantages of fast speed and low power consumption, and can effectively reduce input offset voltage and noise. In the sample and hold circuit section, this design adopts a CMOS fully differential sample and hold circuit, which can handle a wide range of input common mode signals with a small area and low noise. The ADC design in this article adopts a 180 nm 1P4M CMOS process, achieving a signal-to-noise distortion ratio of 14 conversion bits, effective bits of 11.84, and 74.03 dB. The power consumption under 3.3 V power supply is 500.9 μW, and the area is 0.16 mm2.

       

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